Kurt Scheerschmidt: Publications

Journal Articles (refereed) and Book Chapters (below)

• 2015

• K. Scheerschmidt, O. Moutanabbir,
  Tracking Atomic Processes throughout the formation of Heteroepitaxial Interfaces
  Cryst. Res. Technol.50,No.6, 490-498(2015)      PDF      online (full hTML)     
  
  Attention: because of my retirement the reference [39] of the above CRT-paper does no longer show
  a valid url (formerly filetransfer of MPI-Halle), please, cf. typical examples and the cloud-collection
  free-access containing subdirectories with simulated-videos and the related energy-data of
  Ge-deposition onto Si-surfaces calculated by molecuar dynamics

• 2014

• O Moutanabbir, F. Ratto, S. Heun, K. Scheerschmidt, A. Locatelli, and F. Rosei
  Dynamic probe of atom exchange during monolayer growth
  PRB 85(2014)201416(R)      PDF      Link-PRB-APS

• 2012

• C.L. Zheng, K. Scheerschmidt, H. Kirmse, I. Häusler, W. Neumann
  Imaging three-dimensional (Si,Ge) nanostructures by off-axis electron holography
  Ultramicroscopy 124 (2012) 108-116, online published      PDF    
  dx.doi.org/10.1016/j.ultramic.2012.09.004 with crossRefs & fullImages    

• 2010

• K. Scheerschmidt,
  Electron microscope object reconstruction: Retrieval of local variations in mixed type potentials,
  Part 1: Theoretical preliminaries,
  Ultramicroscopy 110 (2010) 543-547      PDF 280KB      dx.doi:10.1016/j.ultramic.2009.11.025 with crossRefs & fullImages
• D. Schulze, K. Scheerschmidt,
  Unentwegt bemüht - in Memoriam Bernd Tesche
  Elektronenmikroskopie 30 (2010) 8-9     PDF copy 256KB     HTML-Link
• Ren Bin Yang, Nikolai Zakharov, Oussama Moutanabbir, Kurt Scheerschmidt, Li-Ming Wu, Ulrich Goesele, Julien Bachmann,
  and Kornelius Nielsch
  The Transition between Conformal Atomic Layer Epitaxy and Nanowire Growth
  Journal of the American Chemical Society 132 (2010) 7592-7594     HTML-Link      PDF 1MB

• 2009

• K. Scheerschmidt,
  Personal reflections to Wolfgang Neumann,
  Cryst. Res. Technol. 44, No. 10 (2009) 1017-1018 / DOI 10.1002/crat.200901017 PDF 0.1MB   
• H. Blanck, D. Litvinov, R. Schneider, D. Gerthsen, T. Passow, and K. Scheerschmidt,
  Quantification of the In-distribution in embedded InGaAs quantum dots by transmission electron microscopy,
  Cryst. Res. Technol. 44 (2009) 1083-1088 / DOI 10.1002/crat.200900513 PDF 0.6MB

• 2008

• A.Rother,K.Scheerschmidt,
  Relativistic effects in elastic scattering of electrons in TEM, Ultramicroscopy (2008) in print,
  doi:10.1016/j.ultramic.2008.08.008 PDF 1.2MB   

• 2007

• Scheerschmidt, K. and Kuhlmann, V.:
  Relaxation of semiconductor nanostructures using molecular dynamics with analytic bond order potentials
  Int. J. Mat. Res. (formely Z. Metallkd.) 98 (2007) 11    PDF 2.3MB   
• Kuhlmann, V. and Scheerschmidt, K.:
  Σ-bond expression for an analytic bond-order potential: Including Pi and on-site terms in the fourth moment
  Phys. Rev. B 76 (2007) 014306    DOI: 10.1103/PhysRevB.76.014306   PDF 239kB  
• Scheerschmidt, K. and Rother, A.
  Electron Microscope Object Reconstruction: Confidence Criteria of Inverse Solutions
  Microscopy and Microanalysis, 13, Suppl. 3 2007, 140-141.    DOI: 10.1017/S1431927607080701   PDF 124kB  
• Scheerschmidt, K.and Kuhlmann, V.:
  Substitution of Atomic Scattering Amplitudes in TEM Interpretation by Analytic Bond Order Potentials
  Microscopy and Microanalysis, 13, Suppl. 3 2007, 22-23.    DOI: 10.1017/S1431927607080117   PDF 4MB  
• Rother, A. and Scheerschmidt, K.:
  A Relativistic Formalism and the Small Angle Approximation of Elastic Electron Scattering in TEM
  Microscopy and Microanalysis, 13, Suppl. 3 2007, 40-41.    DOI: 10.1017/S1431927607080208   PDF 130kB  
• Blank, H., Litviniv, D., Schneider, R. Gerthsen, D., Passow, T., and Scheerschmidt, K.:
  Towards Quantification of the In-Distribution in InGaAs Quantum Dots
  Microscopy and Microanalysis, 13, Suppl. 3 2007, 318-319.    DOI: 10.1017/S1431927607081597   PDF 160kB  
  without Scheerschmidt in printed abstract
• Wilhelm, T., Kuhlmann, V. and Scheerschmidt, K.:
  Bonded semiconductor interfaces with twist and tilt rotation: TEM analysis supported by molecular dynamics structure modeling
  Physica Status Solidi C 4, (8), pp 3115-3119 (2007) PDF 1.5MB  
• Scheerschmidt, K.:
  Rezension of F.Ernst, M.Rühle(Eds.): High-Resolution Imaging and Spectrometry of Materials
  Elektronenmikroskopie 28 (2007) 44     HTML-Link

• 2005

• Scheerschmidt, K. and Werner, M.:
  Carbon at Si (111)-twins: TEM analysis supported by molecular dynamics structure relaxations
  Physica Status Solidi A 202, (12), pp 2368-2375 (2005)    DOI 10.1002/pssa.200521132   PDFhighresolution 2.9MB

• 2004

• Scheerschmidt, K., Kuhlmann, V.:
  Molecular dynamics investigation of bonded twist boundaries
  INTERFACE SCIENCE 12, 157-163, 2004     PDF 1.2MB
• Scheerschmidt, K.:
  Rezension of LM Peng, SL Dudarev MJ Whelan: High Energy Electron Diffraction and Microscopy,
  Monographs on the Physics and Chemistry of Materials 61. oxford Univ. Press 2004
  Z. Kristallogr. 129 (2004) 768   PDF 71kB  

• 2003

• Scheerschmidt, K. and Kuhlmann, V.:
  Atomic structure of twist bonded interfaces: A molecular dynamics study.
  Proceedings of the 203rd Meeting of the Electrochemical Society, Paris, France, 2003.
  Semiconductor Wafer Bonding VII: Science Technology, and Application, Eds.: F.S. Bengtsson, H. Baumgart, C.E. Hunt, T. Suga,
  J. Electrochem. Soc. PV 2003-19, ISBN 1-56677-402-0, pages 259-266   Poster and paper PDF 0.7MB
  (for similar simulations cf. Website and Presentation of D.Go, A.Reina-Cecco,B.Cho)
• Scheerschmidt, K.
  Stability of parameter retrieval using inverse electron scattering
  Microscopy and Microanalysis 9 (2003) 56-57
• Scheerschmidt, K. and Kuhlmann, V.
  Nanostructures simulated by molecular dynamics for TEM analysis
  Microscopy and Microanalysis 9 (2003) 232-233

• 2002

• Scheerschmidt, K., D. Conrad, and A. Belov:
  Atomic processes at bonded Si-interfaces studied by molecular dynamics: Tayloring densities and band gaps?
  Computational Materials Science, 24 (2002) 33-41   PDF 6.4MB  

• 2001

• Koitzsch, C., D. Conrad, K. Scheerschmidt, F. Scharmann, P. Maslarski, and J. Petzold:
  Carbon-induced reconstructions on Si(111) investigated by RHEED and molecular dynamics.
  Appl. Surf. Sci. 179, 49-54 (2001)   PDF 213kB  
• Scheerschmid, K.:
  Molecular dynamics simulations of wafer bonding
  MRS Proceedings Volume 681E, (2001) I2.3   PDF 450Kb
• Scheerschmidt K., D. Conrad, and Y. Wang:
  Tight-binding-based potentials: molecular dynamics of wafer bonding.
  Computational Materials Science 22, 56-61 (2001)   PDF 333Kb

• 2000

• Conrad, D., K. Scheerschmidt and U. Gösele,
  On the possibility of diamond wafer bonding in ultrahigh vacuum
  Appl. Phys. Letters 77 (2000)49-51.   (PS 182Kb)
• Kirmse H., W. Neumann, T. Wiebach, R. Köhler, K. Scheerschmidt, and D. Conrad
  Computer-aided analysis of TEM images of CdSe/ZnSe quantum dots
  Materials Science & Engineering B69-70 (2000)361-366.   PDF 1.1MB
• Koitzsch, C., D. Conrad, K. Scheerschmidt, and U. Gösele
  Empirical molecular dynamic study of SiC(0001) surface reconstructions and bonded interfaces
  J. Appl. Phys. 88 (2000)7104-7109.   PDF 630Kb  
• Scheerschmidt K., D. Conrad, H. Kirmse, R. Schneider, and W. Neumann
  Electron microscope characterization of CdSe/ZnSe quantum dots based on Molecular Dynamics Structure Relaxations
  Ultramicroscopy 81 (2000)289-300.   PDF 1.9Mb  
• Scheerschmidt K., D. Conrad, A.Y. Belov, and D. Timpel
  Enhanced semi-empirical potentials in molecular dynamics simulations of wafer bonding
  Materials Science in Semiconductor Processing, 3(2000)129-135.   PDF 2MB
• Wang Y.C., K. Scheerschmidt, and U. Gösele
  Theoretical investigations of bond properties in graphite and "graphitic" silicon
  Phys. Rev. B61 (2000) 12864-12870.   PDF 2.2Mb  
• Werner P., K. Scheerschmidt, N.D. Zakharov, R. Hillebrand, M. Grundmann, and R. Schneider
  Quantum dot structures in the GaAs System investigated by TEM techniques
  Cryst. Res. Technol. 35 (2000) 759-768.   PDF 1.7Mb  

• 1999

• Belov, A. Y. and K. Scheerschmidt (1999).
  Atomic structures of dislocation intersections at (001) low-angle twist and shear boundaries in silicon.
  Philosophical Magazine Letters 79(3): 107-114.   PDF 333Kb  
• Belov, A.Yu., K. Scheerschmidt, and U. Gösele
  Extended point defect structures at intersections of screw dislocations in Si: A molecular dynamics study
  Phys. Status Solidi (a)171 (1999) 159-166.   PDF 333Kb  
• Belov, A.Yu., R. Scholz, and K. Scheerschmidt
  Dissoziation of screw dislocations in (001)low-angle twist boundaries: a source of the 30degr partial dislocations in silicon
  Philosophical Magazine Letters 79 (1999) 531-538.   PDF 333Kb  
• Kirmse H., W. Neumann, T. Wiebach, R. Köhler, K. Scheerschmidt und D. Conrad
  Interpretation von TEM-Beugungskontrast-Abbildungen von CdSe-Quantenpunkten
  7. Jahrestagung DGK, 08.-10.03.1999, Leipzig,
  Z. Krist. Suppl. 16 (1999) 169.
• Kirmse H., R. Schneider , K. Scheerschmidt, D. Conrad, and W. Neumann
  TEM characterization of self-organized CdSe/ZnSe quantum dots
  J. of Microscopy 194 (1999)183-191.   (PDF 2.7Mb)
• Timpel, D., M. Schaible and K. Scheerschmidt
  Molecular dynamics studies of silica wafer bonding
  J. Appl. Phys. 85 (1999) 2627-2635.   PDF 1Mb  

• 1998

• Belov, A.Yu., D. Conrad, K. Scheerschmidt, and U. Gösele
  Atomistic study of the (001) 90 degree twist boundary in silicon
  Philos. Mag. A77, 55-65 (1998)   PDF 710Kb  
• Conrad, D., and K. Scheerschmidt
  Empirical bond order potential for semiconductors
  Phys.Rev.B 58, 4538-4542 (1998)   PDF 333Kb     Bib-Link
• Scheerschmidt, K.
  Retrieval of object information by inverse problems in electron diffraction
  J. Microscopy 190, 238-248 (1998)   PDF 4.2Mb  
• Timpel, D. and K. Scheerschmidt,
  Molecular dynamics investigations of silver diffusion in glass,
  J. Non-Crystalline Solids 232-234 (1998) 245-251.   PDF 910KMb  
• Scheerschmidt, K., Conrad, D., Belov, A. Y., Stenzel, H.:
  UHV-silicon wafer bonding at room temperature: Molecular dynamics and experiments
  Electrochemical Society Proceedings 97-36, pp 381-392 (1998)   PDF 12Mb

• 1997

• Conrad, D., K. Scheerschmidt and U. Gösele,
  Molecular dynamics studies of interacting hydrogenated Si(001) surfaces,
  Appl. Phys. Letters 71 (1997), 2307-2309.   PDF 26Kb  
• Scheerschmidt K.
  Direct retrieval of object information from diffracted electron waves
  Scanning Microsc. Suppl. 11 (1997) 455-465   PDF 3.4MB  
• Scheerschmidt, K., D. Conrad, A. Belov and U. Gösele,
  Molecular dynamics modelling of silicon wafer bonding,
  Computational Materials Science 9 (1997) 108-115.   PDF 2MB
• Timpel, D., K. Scheerschmidt and S. H. Garofalini
  Silver clustering in sodium silicate glasses - a molecular dynamics stydy
  J. Non-Cryst. Solids 221, 187-198 (1997)     PDF 87Kb
• Timpel, D., Scheerschmidt, K.:
  Molecular dynamics structure simulations of Ag-particles in glass for HREM
  Proceedings of the IXth Conference on Electron Microscopy of Solids, FOTOBIT 1, pp 331-334 (Eds.)
  Czyrska-Filemonowicz, A., Adrian, H., Wojtas, J. and Zielinsky-Lipiecs, A., University of Mining and Metallurgy, Krakow, Poland (1996)   PDF 2MB

• 1996

• D. Conrad, K. Scheerschmidt, U. Gösele,
  Molecular dynamics simulations of silicon wafer bonding,
  Appl. Phys. A 62 (1996) 7-12.   PDF 2Mb  
• W. Neumann, H. Hofmeister, D. Conrad, K. Scheerschmidt, S. Ruvimov,
  Characterization of interface structures in nanocrystalline germanium by means of high-
  resolution electron microscopy and molecular dynamics simulations,
  Zeitschrift für Kristallographie 211 (1996) 147-152.   PDF 2Mb  
• K. Scheerschmidt, D. Conrad, U. Gösele,
  Molecular dynamics simulations to investigate wafer bonded interfaces,
  Computational Materials Science 7 (1996) 40-47.   PDF 60Kb  
• D. Timpel, K. Scheerschmidt, S. Ruvimov,
  HREM Simulations of Particles and Interfaces Refined by Molecular Dynamics Relaxations,
  Materials Science & Engeneering B 37 (1996) 101-107.   PDF 60Kb  
• Ruvimov, S. S., Lilienthal-Weber, Z., Ledentsov, N. N., Grundmann, M., Bimberg, D., Ustinov, V. M., Egorov, A. Y., Kop'ev, P. S., Alferov, Zh. I., Scheerschmidt, K., Gösele, U.:
  TEM structural characterization of nm-scale islands in highly mismatched systems Materials Research Society Symposia Proceedings 421, pp 383-388 (1996)
• Scheerschmidt, K., Conrad, D., Stenzel, H., Gösele, U.:
  Silicon wafer bonding: Molecular dynamics simulations and UHV-experiments
  10. Deutsch-Japanisches Forum Informationstechnologie pp 5 pages (1996)

• 1995

• M. Dubiel, R. Schmitz, K. Scheerschmidt, H. Hofmeister,
  Computer generated random network models of ion exchanged glasses,
  J. Non Cryst. Sol. 192&193 (1995) 632-635.   PDF 10Kb  
• U. Gösele, H. Stenzel, T. Martini, J. Steinkirchner, D. Conrad, K. Scheerschmidt,
  Self-propagating room temperature silicon wafer bonding in ultrahigh vacuum,
  Appl. Phys. Lett. 67 (24) (1995) 3614-3616.   PDF 65Kb  
• A. Höpner, H. Seitz, I. Rechenberg, F. Bugge, M. Procop, K. Scheerschmidt, H. J. Queisser,
  TEM Characterization of the Interface Quality of MOVPE Grown Strained InGaAs/GaAs Heterostructures,
  physica status solidi (a) 150 (1995) 427-437.   PDF 9Mb  
• W. Neumann, H. Hofmeister, D. Conrad, K. Scheerschmidt, S. Ruvimov,
  Charakterisierung von Grenzflächenstrukturen in nanokristallinem Germanium mittels HREM und molekulardynamischen Simulationen,
  Optik 100, Supplement 6 (1995) 74.
• S. Ruvimov, K. Scheerschmidt,
  TEM/HREM Visualization of nm-scale Coherent InAs Islands (Quantum Dots) in a GaAs Matrix,
  physica status solidi (a) 150 (1995) 471-478.   PDF 1.2Mb  
• S. Ruvimov, K. Scheerschmidt, P. Werner, J. Heydenreich, N. Ledensov,
  Elektronenmikroskopische Strukturuntersuchung von (In,Ga)As Quanten Punkten: Kontrastphänomene an relaxierten Wachstumspyramiden,
  Optik 100, Supplement 6 (1995) 67.
• S. Ruvimov, et al.,
  Structural characterization of (In,Ga)As quantum dots in (001) GaAs matrix,
  Phys. Rev. B 51 (1995) 14766-14769.   PDF 2MB
• K. Scheerschmidt, F. Knoll,
  Zur Rekonstruktion von Verschiebungsfeldern aus elektronen-holographisch ermittelten Objektwellen,
  Optik 100, Supplement 6 (1995) 50.
• K. Scheerschmidt, S. Ruvimov, P. Werner, A. Höpner, J. Heydenreich,
  HREM structure characterization of interfaces in semiconducting multilayers using molecular dynamics supported image interpretation,
  Journal of Microscopy 179 (1995) 214-228. PDF 3.3MB
• T. Schellhorn, K. Scheerschmidt, A. Orchowski, H. Lichte, S. Ruvimov,
  Vergleichende Untersuchungen mit Hochauflösungs-Elektronenmikroskopie und Elektronen- Holographie an Halbleiter-Schichtsystemen,
  Optik 100, Supplement 6 (1995) 57.
• D. Timpel, K. Scheerschmidt,
  HREM-Strukturuntersuchungen an Ag- Teilchen in Glas auf der Basis molekulardynamischer Relaxationsrechnungen,
  Optik 100, Supplement 6 (1995) 53.
• D. Timpel, K. Scheerschmidt,
  HREM Simulations of Ag-Particles in Sodium Silicate Glasses Refined by Molecular Dynamics Relaxations,
  physica status solidi (a) 150(1995) 51-63.   PDF 2MB

• 1994

• S. Ruvimov, A. Klein, U. Richter, I. Rechenberg, K. Scheerschmidt, J. Heydenreich,
  TEM study of the rapid degradation of pump laser diodes,
  phys. stat. sol. (a) 146 (1994) 415-424.
• S. S. Ruvimov, J. Heydenreich, R. Scholz, K. Scheerschmidt, N. I. Bochareva, L. M. Sorokin,
  Atomic structure and electronic properties of the Σ=37(610) and Σ=29(520)\[001] tilt grain boundaries in Ge,
  Interface Science 2 (1994) 211-220.   PDF 2.6MB;
• S. S. Ruvimov, K. Scheerschmidt,
  Burgers Vector Determination in TEM by Using the Dislocation Parity Analysis,
  phys. stat. sol. (a) 141 (1994) 269-284.   PDF 4.8MB
• K. Scheerschmidt, F. Knoll,
  Retrieval of Object Information from Electron Diffraction, I. Theoretical Preliminaries,
  phys. stat. sol. (a) 146 (1994) 491-502. PDF 3.9Mb  

• 1993

• R. Bierwolf, M. Hohenstein, R. Hillebrand, K. Scheerschmidt,
  "First- principles" determination of image parameters in HREM,
  Optik Suppl 5 (1993) 50.
• N. I. Bochareva, J. Heydenreich, S. S. Ruvimov, R. Scholz, K. Scheerschmidt, L. M. Sorokin,
  HREM and DLTS of Σ=37(610) and Σ=29(520)\[001] tilt grain boundaries in Ge bicrystals,
  Solid State Phenomena 32&33 (1993) 565-570.   PDF 0.5MB
• R. Hillebrand, H. Hofmeister, K. Scheerschmidt, J. Heydenreich,
  Crystallographic HREM studies of small CdTe crystallites,
  Ultramicroscopy 49 (1993) 252-258.
• A. Orchowski, H. Lichte, K. Scheerschmidt, R. Scholz,
  Hochauflösende Elektronen-Holographie zur Analyse von Σ=13tilt-Korngrenzen in Gold,
  Optik Suppl. 5 (1993) 79.
• K. Scheerschmidt, R. Hillebrand,
  Analyse von HREM-Differenz- Diffraktogrammen bei Voraussetzung der quasi-nichtlinearen Näherung für den Abbildungsprozess,
  Optik Suppl. 5 (1993) 81.
• K. Scheerschmidt, S. S. Ruvimov, R. Scholz, A. Orchowski, J. Heydenreich,
  Einfluss der atomaren Bindung auf die Struktur von Grenzflächen - HREM Untersuchungen zu Ge- und Au-Tilt - Korngrenzen,
  Optik Suppl. 5 (1993) 59.
• K. Scheerschmidt, D. TImpel,
  Molekulardynamische Simulationen der Struktur von Einschlüssen für die HREM-Bildinterpretation,
  Optik Suppl. 5 (1993) 81.
• P. Werner, R. Hillebrand, U. Grohmann, K. Scheerschmidt, H. Hofmeister,
  Untersuchungen zur HREM von kristallinen Materialien unter computer-kontrollierten Abbildungsbedingungen,
  Optik Suppl. 5 (1993) 70.
  

• 1992

• H. Lichte, A. Orchowski, K. Scheerschmidt,
  Electron holography for analysis of a wedge-shaped silicon crystal,
  Optik Suppl. 5 (1992) 31.
• H. Lichte, E. Völkl, K. Scheerschmidt,
  First steps of high resolution electron holography into materials science,
  Ultramicroscopy 47 (1992) 231-240.   PDF 1.7MB
  

• 1990

• K. Scheerschmidt, R. Hillebrand,
  On some limitations in interpreting electron micrographs,
  Physica scripta 42 (1990) 355-358.    PDF 1.1MB
• K. Scheerschmidt, R. Hillebrand,
  On the calculation of electron microscope images of holes and spherical inclusions using the multi-slice method,
  Ultramicroscopy 33 (1990) 27-39.   PDF 1MB
  

• 1989

• R. Hillebrand, K. Scheerschmidt,
  HREM contrast simulations for compound semiconductors - a discussion of appropriate imaging parameters,
  Ultramicroscopy 27 (1989) 375-385.   PDF 0.7MB
• K. Scheerschmidt, Rezension: Sir Nevill F. Mott,
  A life in science, London and Philadelphia: Taylor and Francis, 1986,
  Cryst. Res. Tech. 24 (1989) 198. PDF 1.2MB
• K. Scheerschmidt, R. Hillebrand, J. Heydenreich,
  Computer simulation of diffraction contrast images and lattice fringe patterns of small spherical inclusions,
  Phys. Status Solidi a 116 (1989) 123-143.   PDF 4.2MB

• 1987

• K. Scheerschmidt, R. Hillebrand, J. Heydenreich,
  Simulation of HREM images for models of amorphous solids to evaluate the possibilities of structure interpretation,
  Optik 77 (1987) 115-121.

• 1986

• R. Hillebrand, K. Scheerschmidt, J. Heydenreich,
  Computer simulation of diffraction contrast images and lattice fringe patterns of small hexagonal dislocation loops,
  Ultramicroscopy 20 (1986) 279-292.   PDF 1.2MB

• 1985

• K. Scheerschmidt, R. Hillebrand,
  Calculated defocus difraction contrast and lattice fringe imaging of small crystal defects.,
  Phys. Status Solidi a 91 (1985) 465-482.   PDF 4.7Mb

• 1982

• K. Scheerschmidt, S. A. Nepijko, S. Carl,
  Beobachtung kristalliner Gitterdefekte in der Abbildung von Elektronen - Interferenzen (russ.),
  Ukr. Fiz. Zh. 27 (1982) 726-732.   PDF 1MB

• 1981

• V. N. Roshanskii, I. A. O. Ragimov, K. Scheerschmidt, J. Heydenreich,
  Bestimmung des Typs geneigter Versetzungsringe und Dipole aus dem Kontrast der Aureolen
  um den Durchstosspunkt durch Oberflächen (russ.),
  Fiz. Tverd. Tela 23 (1981) 256-261.   PDF 0.7MB
• K. Scheerschmidt,
  Probleme bei der numerischen Behandlung von Beugung und Beugungskontrast in der Elektronenmikroskopie,
  Wiss. Beitr. Univ. Halle 46 (1981) 50.

• 1978

• S. Carl, K. Scheerschmidt,
  Näherungsverfahren für die Integraldarstellung von Beugungsintensitäten gestörter Kristalle,
  Krist. Tech. 13 (1978) 1135-1140. PDF 1MB
• K. Scheerschmidt, S. Carl, Anwendung der Riemannschen
  Integrationsmethode auf Beugungsprobleme in Blochwellendarstellung,
  Krist. Tech. 13 (1978) 1131-1135. PDF 1MB

• 1977

• K. Scheerschmidt, J. Heydenreich,
  On the computer simulation of the electron microscopic diffraction contrast
  of dislocations in jog and dipole configurations,
  Phys. Status Solidi a 42 (1977) 42-59.   PDF 1.3MB

• 1975

• V. N. Rozanskij, I. A. Ragimov, K. Scheerschmidt, J. Heydenreich,
  Untersuchung des Beugungskontrastes im Fall g.b=0 zur Bestimmung des Vorzeichens der
  Burgersvektoren von Versetzungsringen, Dipolen und Schraubenversetzungen (russ.),
  Fiz. Tverd. Tela 17 (1975) 2705-2711.   PDF 0.7MB
• K. Scheerschmidt.
  Computersimulation des elektronenmikroskopischen Beugungskontrastes von Versetzungsstrukturen am Beispiel von Dipolen und Versetzungssprüngen
  Halle, Univ. Diss., 1975.      (main parts of it are included in the 1977 paper above and the 1977 book appendix cf. H. G. Schneider, J. Woltersdorf (Eds.) below)

• Book Chapters

• 2006

• Scheerschmidt, K.:
  Empirical Molecular Dynamics: Possibilities, Requirements and Limitations, Chapter 9, Pages 213-244
  in: Theory of Defects in Semiconductors, Drabold, David A., Estreicher, Stefan (Eds.),
  Topics in Applied Physics 104, Springer Verlag (to be published Sept. 2006 Hard cover, ISBN:3540334009 )
      link-pgs213-244      chapter9 PDF(1.2MB)

• 2003

• Scheerschmidt, K.:
  Parameter retrieval in electron microscopy by solving an inverse scattering problem
  in: Proceedings of the 6th International Conference on Mathematical and Numerical Aspects
  of Wave Propagation (WAVES 2003) (Ed.) Cohen, G. C., Springer, Berlin, Germany (2003), pp 607-612
    PDF 1.2MB

• 2002

• K. Scheerschmidt and P. Werner:
  Characterization of structure and composition of quantum dots by transmission electron microscopy
  in: Nano-Optoelectronics: Concepts, Physics and Devices, Ed.: M. Grundmann ,
  Springer-Vlg., Bln., Heidelbg., New-York, Tokyo, 2002, Chapter 3, pp. 67-98
    Link to Editor   PDF 3.1MB

• 1997

• Scheerschmidt, K.,
  Retrieval of object information from electron diffraction as ill- posed inverse problems, in: Inverse problems of wave propagation and diffraction,
  in: Proceeding of the Conference in Aix-les-Bains, 23.- 27.9.96,
  Frankreich, Lecture Notes in Physics, Vol. 486, Springer Vlg. Berlin-Heidelberg (1997) p.71-85
    PDF 12.2MB

• 1990

• R. Hillebrand, K. Scheerschmidt,
  Contrast Simulations in High Resolution Electron Microscopy of Amorphous Structures,
  in: Amourphous Structures , D. Schulze (Ed.), Akademie Verlag, Berlin, 1990, vol. 12, p. 229-254.

• 1987

• W. Neumann, K. Scheerschmidt,
  Electron diffraction - fundamentals and applications,
  in: Electron microscopy in solid state physics , H. Bethge, J. Heydenreich (Eds.), Elsevier, Amsterdam [u.a.], 1987, p. 59-96.
• K. Scheerschmidt,
  The theoretical foundations of diffraction contrast in the electron microscope for lattice defect imaging and its computer simulation,
  in: Electron microscopy in solid state physics , H. Bethge, J. Heydenreich (Eds.), Elsevier, Amsterdam [u.a.], 1987, p. 535-563.
• K. Scheerschmidt, R. Gleichmann,
  Lattice defect imaging by diffraction contrast,
  in: Electron microscopy in solid state physics , H. Bethge, J. Heydenreich (Eds.), Elsevier, Amsterdam [u.a.], 1987, p. 289-324.

• 1984

• R. Hillebrand, K. Scheerschmidt, W. Neumann, P. Werner, A. Pippel,
  Bildinterpretation in der Hochauflösungs-Elektronenmikroskopie,
  in: Beiträge zur Forschungstechnologie , Akademie-Verl., Berlin, 1984, vol. 11, .     preview

• 1982

• M. Pasemann, K. Scheerschmidt,
  Gitterdefekt-Abbildung durch elektronenmikroskopischen Beugungskontrast,
  in: Elektronenmikroskopie in der Festkörperphysik , H. Bethge, J. Heydenreich (Eds.), Dt. Vlg. Wiss. und Springer Vlg, Berlin, 1982, p. 257-294.
• K. Scheerschmidt,
  Theoretische Grundlagen des elektronenmikroskopischen Beugungskontrastes (einschliesslich Computersimulation der Abbildung von Kristalldefekten),
  in: Elektronenmikroskopie in der Festkörperphysik , H. Bethge, J. Heydenreich (Eds.), Dt. Vlg. Wiss. und Springer Vlg, Berlin, 1982, p. 511-535.

• 1977

• K. Scheerschmidt,
  Computersimulation des elektronenmikroskopischen Bildkontrastes von Versetzungen,
  in: Strukturen kristalliner Phasengrenzen, Elektronenmikroskopischer Bildkontrast , H. G. Schneider, J. Woltersdorf (Eds.),
  VEB Deutscher Verlag für Grundstoffindustrie, Leipzig, 1977, p. 222-258.
  cf. chapter 3 of book appendix, PDF 13.7MB

• 1976

• J. Heydenreich, K. Scheerschmidt,
  Versetzungskontrast in der Transmissionselektronenmikroskopie,
  in: Dynamische Interferenztheorie - Grundlagen und Anwendungen bei Röntgenstrahlung, Elektronen und Neutronen ,
  O. Brümmer, H. Stephanik (Eds.), Akad. Verlagsges. Geest & Portig, Leipzig, 1976, p. 307-323.