Kurt Scheerschmidt, Publications

Conference Proceedings (partially refereed),Talks & Lectures (selected)

• 2018

• K. Scheerschmidt, short talk at the Holo-Workshop of "The Berlin Network of EM", Seehotel Zeuthen, 2018, June 26 - June 28
  Slides          Program

• 2016

• K. Scheerschmidt,
  Laudatio für Hannes Lichte anläßlich der Verleihung der Ehrenmitgliedschaft der Bethge-Stiftung Halle (Saale) Text (38kB, deutsch)      Bilder (15MB)

• 2014

• K. Scheerschmidt, short talk at the Triebenberg-Holo-Workshop, University Dresden, 2014, June 10 - June 12
  Slides          Program

• 2012

• K. Scheerschmidt,
  Empirical molecular dynamics simulations to analyse holographically determined mean inner potentials,
  Pico2012, Symposium on Frontiers of Aberration Corrected Electron Microscopy (Knut Urban Symposium, Inauguration of ER-C Annexe and Commissioning of PICO), Jülich Research Centre 29.2.-2.3.2012, Poster
• K. Scheerschmidt, O. Moutanabbir, On the genesis of Ge/Si epitaxial interfaces: Tracking the behavior of deposited atoms using molecular dynamics with analytic bond order potentials, 6th Intern. Conf. on Multiscale Materials Modeling, MMM2012, Oct. 15-19, 2012, Singapore, abstract A3-2
  PDF-short-abstract   

• 2011

• K. Scheerschmidt,
  Electron crystallography based on inverse dynamic scattering,
  Proc. XXII International Congress of Crystallography, Madrid 22.-30.8.2011, Acta Cryst. A67 (2011)C693
• K. Scheerschmidt,
  Electron crystallography via local TEM parameter determination for mixed type potentials using inverse object retrieval,
  Proc. Microscopy Conference, Kiel 2011, im4_416 (talk)
  ExtendedAbstract PDF 0.5MB   
• K. Scheerschmidt,C.L.Zheng,H.Kirmse,I.Häusler,W.Neumann
  Molecular dynamics simulations of (Si, Ge) quantum dots to quantify the shape analysis by electron holographic pahse measurements,
  Proc. Microscopy Conference, Kiel 2011, im2_p134 (poster)
  ExtendedAbstract PDF 0.5MB   

• 2010

• K. Scheerschmidt,
  Accuracy of local TEM parameter determination for mixed type potentials using inverse object retrieval,
  Proc. IMC-17, International Microscopy Conference, RiodeJaneiro, Brazil, 20.9.-24.9.2010, I8-15 (2pages)
  ExtendedAbstract PDF 0.5MB   
• K. Scheerschmidt, C.I. Zheng, H. Kirmse, I. Häusler, and W. Neumann,
  Molecular dynamics simulations of (Si,Ge) quantum dots to quantify the shape analysis by electron holographic phase measurement,
  Proc. IMC-17, International Microscopy Conference, RiodeJaneiro, Brazil, 20.9.-24.9.2010, I8-4 (2pages)
  ExtendedAbstract PDF 0.5MB   

• 2009

• K. Scheerschmidt,
  Von Holographie zur Rekonstruktion: ganz invers gesehen,
  Festvortrag zum Ehrenkolloquium fuer Prof. Dr. Hannes Lichte an der TU-Dresden, 23.10.2009
  Programm      PPT       Report & HoloTübingen aus Elektronenmikroskopie 30 (2010) PDF 852KB     HTML-Link
• K. Scheerschmidt,
  Electron microscope object reconstruction: Retrieval of local variations in mixed type potentials,
  Proc. MC2009, Microscopy Conference, Graz, Austria, 30.8.-4.9.2009, Vol. 1, p. 37-38
• H. Blank, D. Litvinov, R. Schneider, D. Gerthsen, T. Passow, K. Scheerschmidt
  Towards quantification on the In-concentration in InAs quantum dots
  39th Winter Colloquium Physics of Quantum Electronics (PQE-2009), Snowbird, USA,
  04.01.2009 - 08.01.2009      Abstract PS 1.2MB     

• 2008

• Scheerschmidt, K.:
  Correction of the object wave using iteratively reconstructed local object tilt and thickness
  EMC 2008, 14th European Electron Microscopy Congress, Aachen, 1.-5.9.2008
  Poster     Abstract pdf 0.5MB          Abstract jpg 0.2MB     
• Scheerschmidt, K.:
  Description of electron microscope image details based on structure relaxations with enhanced interaction potentials
  EMC 2008, 14th European Electron Microscopy Congress, Aachen, 1.-5.9.2008
  Poster
• C.L.Zheng, H. Kirmse, I.Häusler,K.Scheerschmidt,W.Neumann:
  Reconstruction of QD(Ge,Si) islands by 2D phase mapping,
  EMC2008, 14th European Microscopy Congress, 1-5Sept.2008, Aachen,Germany
  Vortrag
• Scheerschmidt, K.:
  Molecular dynamics of strained nanostructures: Models for better TEM interpretation
  NANOTEM School 2008, University Cadiz, Spain, 29.5.2008
  Invited talk   
• Scheerschmidt, K.:
  Molecular dynamics simulations and HRTEM investigations at semiconductor interfaces
  MPI Stuttgart, 7.1.2008
  Invited talk

• 2007

• Scheerschmidt, K. and Kuhlmann, V.:
  Extended defects in semiconductors: MD using BOP and elastic BC
  Workshop Towards Reality in Nanoscale Materials, 10.-12.12.2007, Levi, Lapland, Finland   
  Poster
• Scheerschmidt, K.:
  Electron image interpretation based on charge densities and bond order potentials (BOPs)
  Materialwiss. Seminar, Humboldt-Univ. Berlin, 13.11.2007
  Invited talk
• Scheerschmidt, K.:
  Simulation elektronenmikroskopischer Abbildungen von Quantenpunkten
  Laboratorium für Elektronenmikroskopie der Universität Karlsruhe, 23.7.2007
  Invited talk
• Scheerschmidt, K.:
  Bond order potentials and atomic structure factors
  3rd European Workshop on Electron Holography, 27th - 30th May 2007, Dresden, Germany
  Invited talk
• Scheerschmidt, K. and Kuhlmann, V.:
  Relaxation of semiconductor interfaces by molecular dynamics using enhanced bond order potentials
  CECAM-Workshop "Multiscale Approaches to Nanomechanics, February 5th-7th,2007,Lyon, France   
  Poster
• Scheerschmidt, K. and Rother, A.
  Electron Microscope Object Reconstruction: Confidence Criteria of Inverse Solutions
  Proceedings Microscopy Conference MC2007, Saarbrücken, Germany, 2.-7.9.,2007
  Microscopy Conference MC2007, Saarbrücken, Germany, 2.-7.9.,2007
  Microscopy and Microanalysis, 13, Suppl. 3 2007, 140-141.    PDF 120KB
  Poster
• Scheerschmidt, K.and Kuhlmann, V.:
  Substitution of Atomic Scattering Amplitudes in TEM Interpretation by Analytic Bond Order Potentials
  Proceedings Microscopy Conference MC2007, Saarbrücken, Germany, 2.-7.9.,2007
  Microscopy Conference MC2007, Saarbrücken, Germany, 2.-7.9.,2007
  Microscopy and Microanalysis, 13, Suppl. 3 2007, 22-23.    PDF 120KB
  Poster
• Rother, A. and Scheerschmidt, K.:
  A Relativistic Formalism and the Small Angle Approximation of Elastic Electron Scattering in TEM
  Proceedings Microscopy Conference MC2007, Saarbrücken, Germany, 2.-7.9.,2007
  Microscopy Conference MC2007, Saarbrücken, Germany, 2.-7.9.,2007
  Microscopy and Microanalysis, 13, Suppl. 3 2007, 40-41.   
  Invited talk
• Blank, H., Litviniv, D., Schneider, R. Gerthsen, D., Passow, T., and Scheerschmidt, K.:
  Towards Quantification of the In-Distribution in InGaAs Quantum Dots
  Proceedings Microscopy Conference MC2007, Saarbrücken, Germany, 2.-7.9.,2007
  Microscopy Conference MC2007, Saarbrücken, Germany, 2.-7.9.,2007
  Microscopy and Microanalysis, 13, Suppl. 3 2007, 318-319.   
  without Scheerschmidt in printed abstract
  Poster

• 2006

• Holm Kirmse, Ines Häusler, Irmela Hähnert, Wolfgang Neumann, and Kurt Scheerschmidt
  Computer assisted analysis of diffuse electron diffraction of precipitates in GaAs
  23rd European Crystallographic Meeting ECM23, Leuven, 2006 Acta Cryst. (2006), A62 s49, m15.o=5   PDF 44KB
• Kurt Scheerschmidt, Volker Kuhlmann:
  Bond order potentials to include charge densities in TEM image interpretation
  Proc. Intern. Conf. on Density Functional Theory and Transmisson Electron Microcopy, DFTEM2006, Poster 84   
  Vienna, Austria, 21.-23.4.2006,pp. 167-170   PDF 208KB  
  Poster
• Kurt Scheerschmidt, Volker Kuhlmann, Axel Rother, and Sibylle Gemming:
  Electron Imaging based on Charge Density Potentials and Frozen Lattices
  Proc. 16. Intern. Microscopy Congress, Sapporo, Japan, 3.-8.9.2006,Vol.2,p.739     PDF 438KB  
  Poster
• Axel Rother and Kurt Scheerschmidt:
  On the relativistic Correction in Electron Scattering Simulations
  Proc. 16. Intern. Microscopy Congress, Sapporo, Japan, 3.-8.9.2006,Vol.2,p.643  
  Poster
• H. Kirmse, I. Häusler, I. Hähnert, W. Neumann, K. Scheerschmidt, F.-M. Kiessling, and P. Rudolph:
  Computer-Aided TEM Analysis of Precipitates in GaAs Crystals
  Proc. 16. Intern. Microscopy Congress, Sapporo, Japan, 3.-8.9.2006,Vol.2,p.1448  
  Poster
• Kurt Scheerschmidt and Volker Kuhlmann:
  Relaxation of Semiconductor Nanostructures using Molecular Dynamics with Analytic Bond Order Potentials
  Proc. Multiscale Materials Modelling, MMM2006, Freiburg, 18.-22.9.2006 Ed. P. Gumbsch, pp.102-105   
  Vortrag   PDF 0.7MB
• Thomas Wilhelm, Volker Kuhlmann, and Kurt Scheerschmidt:
  Bonded Semiconductor Interfaces with Twist and Tilt Rotation: TEM Analysis supported by Molecular Dynamics Structure Modelling
  Proc. Extended Defects in Semiconductors, EDS2006, 17.-22.9.2006, Halle/Saale      PDF 225KB
  Vortrag
• Kurt Scheerschmidt and Hannes Lichte
  Electron Microscope Object Reconstruction: Confidence Criteria of Inverse Solutions
  Proc.Int. Conf. Appl. Cryst., Wisla, Poland, 10.-15.9.2006   
  Poster
• Kurt Scheerschmidt:
  TEM analysis by means of molecular dynamics
  Summer School on Stress/Strain Determination by TEM Methods, Wisla, Poland, 14.-17.9.2006,
  invited talk   

• 2005

• K. Scheerschmidt: Molecular dynamics modeling for enhanced interpretation of TEM images
  Workshop on Advanced Method for Interpretation of TEM, X-Ray and SIMS
  Measurements in Nano and Atomic Scale (CEPHEUS 2005),
  Warsaw, Poland, 01.06.2005 - 03.06.2005,
  invited talk   PDF 225KB  
• Axel Rother, Kurt Scheerschmidt, and Hannes Lichte: Special aspects on the scattering of high-energetic electrons on crystals
  6th Dreiländertagung - Microscopy Conference 2005, Davos, Switzerland, 28.08.2005 - 02.09.2005   
  PSI Proceedings 05-01, pp 22 (2005)   PDF 225KB  
  Poster
• Scheerschmidt, K.: The frozen lattice model: Is it valid to describe thermal diffuse electron scattering
  6th Dreiländertagung - Microscopy Conference 2005, Davos, Switzerland, 28.08.2005 - 02.09.2005   
  PSI Proceedings 05-01, pp 23 (2005)   PDF 225KB  
  invited talk
• Scheerschmidt, K.: Object parameter retrieval using inverse electron diffraction including potential differences
  6th Dreiländertagung - Microscopy Conference 2005, Davos, Switzerland, 28.08.2005 - 02.09.2005   
  PSI Proceedings 05-01, pp 39 (2005)   PDF 627KB  
  Poster
• K. Scheerschmidt, V. Kuhlmann, A.Y. Belov :
  Enhanced empirical molecular dynamics of semiconductor nanostructures: Elastic boundary conditions and bond order potentials
  European Congress on Advanced Materials and Processes (EUROMAT 2005), Prague, Czech Republic, 05.09.2005 - 08.09.2005  
• Scheerschmidt, K.:
  Direct retrieval od object information using inverse solutions of dynamical electron diffraction
  European Congress on Advanced Materials and Processes (EUROMAT 2005), Prague, Czech Republic, 05.09.2005 - 08.09.2005   
• V. Kuhlmann and K. Scheerschmidt: Bond Order Potential for Molecular Dynamics Simulation: Relaxation of Semiconductor Nanostructures
  CECAM Workshop "Ab Initio Meets Classical Simulations: The Development of Empirical Potentials for Atomistics Systems" Lyon, France, 17.10.-19.10.2005   

• 2004

• Werner, M. and Scheerschmidt, K., Pippel, E., Funke, C., Möller, H. J.:
  Carbon in multicrystalline ribbon-silicon for solar cell application
  Proceedings of the 13th International Conference on Microscopy of Semiconducting Materials 180, pp 65-68
  (Eds.) Cullis, A. G. and Midley, P. A., Bristol, United Kingdom (2004)    PDF 0.5MB
• Otto, R., Häusler, I., Kirmse, H., Neumann, W., Pohl, U. W., Bimberg, D., Scheerschmidt, K.:
  Determination of composition and strain field of GaSb_yAs_1-yQDs in In_xGa_1-xAs seed by means of qHRTEM
  EMC2004, Proc. 13st European Microscopy Congress,Antwerp, Belgium, 22.-27.8.2004,Poster
  Proceedings 13. European Microscopy Congress 2, pp 193-194 (Eds.) Schryvers, D. and Timmermann, J.-P., (2004)
• Scheerschmidt, K.:
  Stability of object parameters retrieved by inverse solutions of electron diffraction
  Proceedings 13. European Microscopy Congress 1, pp 189-190 (Eds.) Schryvers, D. and Timmermans, J.-P., Belgian Society for Microscopy, Liege (2004)   PDF 2MB
• Scheerschmidt, K. and Werner, M.:
  Carbon at Si(111)-twins: TEM analysis supported by molecular dynamics structure relaxations
  Proceedings 13. European Microscopy Congress 1, pp 105-106 (Eds.) Schryvers, D. and Timmermans, J.-P., Belgian Society for Microscopy, Liege (2004).   PDF 2MB
• M. Werner, K. Scheerschmidt:
  Carbon at twin-boundaries in multicrystalline ribbon silicon.
  EMC2004, Proc. 13st European Microscopy Congress, Antwerp, Belgium, 22.-27.8.2004 Eds.) Schryvers, D. and Timmermans, J.-P., Belgian Society for Microscopy, Liege (2004), pp 403-404   PDF 2MB
• Scheerschmidt, K., V. Kuhlmann, and A. Y. Belov.
  Relaxation of interface defects: Elastic boundary conditions and bond order potentials in empirical molecular dynamics simulations.
  CMD-EPS2004: 20th General Conference of the Condensed Matter Division of the European Physical Society, Prag, Czech Republic. 19. - 23.07.2004.
  Poster
• A.Yu. Belov, K. Scheerschmidt:
  Extended molecular dynamics simulations of interfaces and defects: elastic flexible boundary conditions.
  E-MRS 2004, Proc. European Materials Research Society Spring Meeting 2004, Strasbourg, France, 24.-28.5.2004, Poster H/P17
• Werner, M. and Scheerschmidt, K., Pippel, E., Funke, C., Möller, H. J.:
  Carbon in multicrystalline ribbon-silicon for solar cell application Proceedings of the 13th International Conference on Microscopy of Semiconducting Materials 180, pp 65-68 (Eds.)
  Cullis, A. G. and Midgley, P. A.,Bristol, United Kingdom (2004)
• K. Scheerschmidt:
  Relaxation of nanostructures: Molecular dynamics simulations using empirical potentials
  CECAM Workshop: Modeling of selfassempled semiconductor nanostrucures, Lyon, France, 28.6.-30.6.2004,
  Invited 5553_04
• K. Scheerschmidt:
  The inverse object reconstruction in electron microscopy,
  International Holography-Workshop at Triebenberg Laboratory, Dresden, Germany, 29.8.-1.9.2004,
  Invited P5554_04
• K. Scheerschmidt: Stability of object parameters retrieved by inverse solutions of electron diffraction. EMC2004, Proc. 13st European Microscopy Congress, Antwerp, Belgium, 22.-27.8.2004, Eds.: D. Schryvers, J.-P. Timmermans et al., Vol. I, pp.189-190.
• K. Scheerschmidt, M. Werner: Carbon at Si(111)-twins: TEM analysis supported by molecular dyxnamics structure relaxations. EMC2004: 13st European Microscopy Congress, Antwerp, Belgium, 22.-27.8.2004, P5555_04
• A.Yu. Belov, K. Scheerschmidt: Extended molecular dynamics simulations of interfaces and defects: elastic flexible boundary conditions. E-MRS 2004, Proc. European Materials Research Society Spring Meeting 2004, Strasbourg, France, 24.-28.5.2004, Poster H/P17 P5552_04
• Kuhlmann, V. and K. Scheerschmidt. Application of an analytic bond order potential in empirical molecular dynamics simulations. CMD-EPS2004: 20th General Conference of the Condensed Matter Division of the European Physical Society, Prag, Czech Republic. 19. - 23.07.2004, Poster. P5560_04

• 2003

• K. Scheerschmidt:
  Stability of parameter retrieval using inverse electron scattering
  MC2003, Proc. 31st Conference Deutsche Gesellschaft für Elektronenmikroskopie, Dresden, Germany 7.-12.9.2003, Eds.: Th. Gemming, M. Lehmann, H. Lichte, K. Wetzig,
  Microsc. Microanal. 9 (Suppl. 3), 2003, 56-57
• Scheerschmidt, K.:
  Parameter retrieval in electron microscopy by solving an inverse scattering problem
  in: Proceedings of the 6th International Conference on Mathematical and Numerical Aspects
  of Wave Propagation (WAVES 2003) (Ed.) Cohen, G. C., Springer, Berlin, Germany (2003), pp 607-612
• K. Scheerschmidt, V. Kuhlmann:
  Nanostructures simulated by molecular dynamics for TEM analysis
  MC2003, Proc. 31st Conference Deutsche Gesellschaft für Elektronenmikroskopie, Dresden, Germany 7.-12.9.2003, Eds.: Th. Gemming, M. Lehmann, H. Lichte, K. Wetzig,
  Microsc. Microanal. 9 (Suppl. 3), 2003, 232-233
• Scheerschmidt, K. and Kuhlmann, V.:
  Atomic structure of twist bonded interfaces: A molecular dynamics study.
  Proceedings of the 203rd Meeting of the Electrochemical Society, Paris, France, 2003.
  Semiconductor Wafer Bonding VII: Science Technology, and Application, Eds.: F.S. Bengtsson, H. Baumgart, C.E. Hunt, T. Suga,
  J. Electrochem. Soc. PV 2003-19, ISBN 1-56677-402-0, pages 259-266   Poster and paper PDF 0.7MB
  (for similar simulations cf. Website and Presentation of D.Go, A.Reina-Cecco,B.Cho)
• K. Scheerschmidt:
  Empirical Molecular dynamics simulations for nanostructure characterization
  CECAM Workshop, Lyon 15.6.-19.6,
  invited talk
• K. Scheerschmidt: Stability of parameter retrieval using inverse electron scattering MC2003, 31st Conference Deutsche Gesellschaft für Elektronenmikroskopie, Dresden, Germany 7.-12.9.2003 Dresden, 7.-12.9.03
• K. Scheerschmidt:
  Parameter retrieval in electron microscopy by solving an inverse scattering problem
  WAVES2003, 6th Int. Conf. on Mathematical and Numerical Aspects of Wave Propagation,Jyv\"askyl\"a, Finland, 30.7.-4.8.03
  talk
• V. Kuhlmann and K. Scheerschmidt:
  Bond-order potential for molecular dynamics simlations: from theory to application
  Zeijang University, Hanghzon, VR China, 22.10.2003
  Invited talk
• M. Werner, K. Scheerschmidt, E. Pippel, C. Funke, H.J. Möller:
  Carbon in multicrystalline ribbon-silicon for solar cell application
  Thirteenth International Conference on Microscopy of Semiconductor Materials, Cambridge, UK. 31.03. - 03.04.2003
  Poster

• 2002

• K. Scheerschmidt:
  Direct retrieval of local thickness and orientation by inversion of electron diffraction,
  Proceedings ICEM 15, International Congress of Electron Microscopy, Durban, South Africa, 1.-6.9.2002, Vol. 1, pp. 281-282.
• K. Scheerschmidt:
  Twist bonded interfaces: TEM and structure simulations,
  Proceedings ICEM 15, International Congress of Electron Microscopy, Durban, South Africa, 1.-6.9.2002, Vol. 3, pp. 533-534.
• K. Scheerschmidt:
  Molecular dynamics investigation of bonded twist boundaries,
  Euro Conference on Structure and Composition of Interfaces in Solids Schw\"abisches Bildungszentrum Kloster Irsee, Irsee, 19.-23.8.02, invited
• K. Scheerschmidt:
  Possibilities of Object Reconstruction in Electron Microscopy,
  Autumn School: Progress in Materials Science through Microscope Methods, Berlin, 28.9.-2.10,02,
  invited Talk
• K. Scheerschmidt:
  Beiträge zur direkten Objektrekonstruktion aus Elektronenwellen
  Workshop der Arbeitsgruppe Hochauflösungs-Elektronenmikroskopie der DGE, Jülich, 9.-11.6.02
• R. Schneider, I. Hähnert, K. Scheerschmidt, M. Hanke, H. Wawra, T. Boeck and W. Neumann:
  Structural and chemical characterization of (Si,Ge) Islands on Si,
  ICEM 15, 15th International Congress of Electron Microscopy, Durban, South Africa, 1.-6.9.02,
  Poster (Proceedings, Vol. 1, pp 111-112, without Scheerschmidt and Hanke)
• Molecular dynamics simulations of bonded interfaces with twist rotation
  NEOP International Workshop on Nanostructures for Electronics and Optics, Dresden, 6.-9.10.2002, Poster
• K. Scheerschmidt: Comments on quantitative TEM and HREM
  JEOL User Meeting, Halle, 27.-29.10.2002, Talk
• V. Kuhlmann and K. Scheerschmidt: Molecular dynamics simulations of twist-bonded interfaces
  JEOL User Meeting, Halle, 27.-29.10.2002, Poster
• K. Scheerschmidt: Parameter retrieval as inverse diffraction problem
  JEOL User Meeting, Halle, 27.-29.10.2002, Poster
  

• 2001

• Kurt Scheerschmidt:
  Application of molecular dynamics: HREM-simulation of bonded interfaces
  Dreiländertagung für Elektronenmikroskopie" - A Conference on Modern Microscopical Methods, Innsbruck, 9.-14.9.2001, Symposium C3: Interfaces Poster C3P9
• Kirmse, H., R. Schneider, K. Scheerschmidt, R. Scholz, M. Lentzen, F. Henneberger, and W. Neumann:
  HRTEM investigations of CdSe/ZnSe quantum dots
  Dreiländertagung für Elektronenmikroskopie" - A Conference on Modern Microscopical Methods, Innsbruck, 9.-14.9.2001, Symposium C2: Nanostructured Materials Vortrag
• Ute Kaiser, K. Scheerschmidt:
  On the location of foreign atoms in hexagonal SiC
  Dreiländertagung für Elektronenmikroskopie" - A Conference on Modern Microscopical Methods, Innsbruck, 9.-14.9.2001, Symposium C2: Nanostructured Material Vortrag
• Kurt Scheerschmidt, Detlef Conrad, and Alexander Belov:
  Molecular dynamics investigation of bonded interfaces: Tayloring densities and band gaps?
  E-MRS2001 Spring Meeting, Strasbourg 5.-8.6.2001, Symposium A: Computational Materials Science Across Time and Length Scales
  Vortrag AI.6
• Kurt Scheerschmidt:
  Molecular dynamics simulations of wafer bonding
  2001 MRS Spring Conference, San Francisco, April 16-20, 2001
  Symposium I: Wafer bonding and thinning techniques for materials integration
  MRS Proc. Volume 681E, eingeladener Vortrag I2.3
• Kurt Scheerschmidt:
  Inversion of dynamic scattering: Determination of local object thickness and orientation
  Dreiländertagung für Elektronenmikroskopie" - A Conference on Modern Microscopical Methods,
  Innsbruck, 9.-14.9.2001, Symposium A3: Quantitative high resolution TEM
  Keynote lecture
• Preparing committee and chairmen of Symposium C2 "Nanostructured Materials"
  Dreiländertagung für Elektronenmikroskopie" - A Conference on Modern Microscopical Methods,
  Innsbruck, 9.-14.9.2001
• Kurt Scheerschmidt:
  Ambiguities in inverse object reconstruction
  Workshop: Quantitative High Resolution Electron Microscopy, Universität Dresden, 28.-29.6.2001

• 2000

• Scheerschmidt, K.:
  Direct object data retrieval: an inversion of electron diffraction
  Proceedings of the 12th European Congress on Electron Microscopy 3, pp 135-136 (Eds.) Frank, L., Ciampor, F., Gemperlova, J. and Vavra, I., Czechoslovak Society of Electron Microscopy, Brno, Czech Republic (2000)
• Scheerschmidt, K., Werner, P.:
  Analysis of nanostructures by EM techniques: quantum dots
  Proceedings of the 12th European Congress on Electron Microscopy 2, pp 585-588 (Eds.) Frank, L., Ciampor, F., Gemperlova, J. and Vavra, I., Czechoslovak Society of Electron Microscopy, Brno, Czech Republic (2000)
• Conrad, D., K. Scheerschmidt, ,P. Werner, and U. Goesele.
  Molecular dynamics of diamond wafer bonding.
  CIMTEC 2000, Lido de Jeselo, Italy, 30.05.2000.
• Koitzsch, C., F. Scharrmann, j. Petzold, K. Scheerschmidt, and D. Conrad.
  Carbon induced reconstruction on Si (111) investigated by RHEED and empirical molecular dynamics.
  11. Arbeitstagung Angewandte Oberflächenanalytik AOFA11, Leipzig, 24.-28.09.2000.
• Neumann, W. and K. Scheerschmidt (2000).
  Analysis of electron microscopical image contrasts: trial and error methods versus inverse problems.
  Workshop, Mathematisches Forschungsinstitut, Oberwolfach, 03.-09.12.2000.
• Scheerschmidt, K. (2000).
  Atomare Prozesse beim Waferbonden: Molekulardynamische Untersuchungen.
  Materialwissenschaftliches Seminar der Humboldt-Universität, Berlin, 20.07.2000.
• Scheerschmidt, K. (2000).
  Object data retrieval as inverse problems of electron diffraction.
  Workshop RCP264: Inverse Problems and Nonlinearity, Montpellier, France, 20.-24.06.2000.
• Scheerschmidt, K. and D. Conrad (2000).
  Modified empirical potentials for molecular dynamics modelling of bonded interfaces.
  Ψ_K 2000 Conference, Schwäbisch-Gmünd, 22.-26.08.2000.
• Scheerschmidt, K., D. Conrad, et al. (2000).
  Tight-binding based empirical potentials: Molecular dynamics of wafer bonding.
  10th Workshop on Computational Material Science (CMS2000)., Tanka Village, Villasimius, Sardinia, 07.-12.09.2000.

• 1999

• Neumann W., H. Kirmse, R. Schneider, K. Scheerschmidt, D. Conrad, T. Wiebach, and R. Koehler
  Computer-aided analysis of TEM micrographs of CdSe quantum on ZnSe
  Proc. XI. Int. Conf. on Microsc. of Semicond. Materials, Oxford 1999,
  Inst. Phys. Conf. Ser. ???(1999), 145-148.
• Kirmse H., W. Neumann, T. Wiebach, R. Köhler, K. Scheerschmidt und D. Conrad
  Interpretation von TEM-Beugungskontrast-Abbildungen von CdSe-Quantenpunkten
  7. Jahrestagung DGK, 08.-10.03.1999, Leipzig, Suppl. Z. Krist. 16 (1999) 169-170.
• K. Scheerschmidt
  Inversion of dynamic scattering: Determination of local object thickness and orientation
  EMAG99, Electron Microscopy and Analysis Group Conference, Sheffield, 25-27.8.1999 Inst. Phys. Conf. Ser. 161 (1999) 141-144.
  paper (PS 3.5Mb)
• K. Scheerschmidt, A.Y. Belov, and D. Conrad
  Structure modelling by molecular dynamics: Analysis of TEM images of bonded interfaces
  EMAG99, Electron Microscopy and Analysis Group Conference, Sheffield, 25-27.8.1999 Inst. Phys. Conf. Ser. 161 (1999) 71-74.
• K. Scheerschmidt
  Behandlung der dynamischen Beugung als Inverses Problem: Bestimmung von lokalen Objektdicken und Orientierungen
  Optik, Suppl. 8 , Vol.110 (1999) 76
• P. Werner, K. Scheerschmidt, N.D. Sacharov, M. Grundmann, A. Taurino und R. Schneider
  Morphology and Strain: TEM Image Contrast of Self-Assembled Quantum Dot Structures of Semiconducting Materials
  Optik, Suppl. 8 Vol.110 (1999) 63
• H. Kirmse, W. Neumann, T. Wiebach, R. Koehler, K. Scheerschmidt und D. Conrad Quantitative Analyse elektronenmikroskopischer Bildkontraste von CdSe/ZnSe-Quantenpunkten
  Optik, Suppl. 8 Vol.110 (1999) 30
• Scheerschmidt K. , P. Werner, and M. Grundmann
  Electron microscope structure investigation of quantum dots: Molecular dynamics and image simulations
  Verhandlungen der DPG, Frühjahrstagung des AK Festkörperphysik, 22.-26.3.1999, Muenster Vortrag HL17.7, Abstracts S 741
• Neumann W., H. Kirmse, R. Schneider, K. Scheerschmidt, D. Conrad, T. Wiebach, and R. Koehler
  Computer-aided analysis of TEM micrographs of CdSe quantum on ZnSe
  Proc. XI. Int. Conf. on Microsc. of Semicond. Materials, Oxford 1999 Vortrag ?
• Scheerschmidt K.
  Inversion of dynamic scattering: Determination of local object thickness and orientation
  EMAG99, Proceedings of the Institute of Physics, Electron Microscopy and Analysis Group Conference, University of Sheffield, 25-27.8.1999 Institute of Physics Conference Series No. (Bristol-London: IOP) p. Vortrag ECR.3, Abstracts S44
• Scheerschmidt K., A.Y. Belov, and D. Conrad
  Structure modelling by molecular dynamics: Analysis of TEM images of bonded interfaces
  EMAG99, Proceedings of the Institute of Physics, Electron Microscopy and Analysis Group Conference, University of Sheffield, 25-27.8.1999 Poster: INT.P8, Abstracts S. 21
• Scheerschmidt K.
  Behandlung der dynamischen Beugung als Inverses Problem: Bestimmung von lokalen Objektdicken und Orientierungen
  29. Tagung der DGE, Dortmund, 5.-10.9.1999
  Optik, Suppl. 8 , Vol.110 (1999) 76 Poster 1615
• Scheerschmidt K. , D. Conrad und A.Y. Belov
  Kristalldefekte an gebondeten Grenzflaechen: MD-Strukturrelaxation und HREM-Bildsimulation
  29. Tagung der DGE, Dortmund, 5.-10.9.1999
  Optik, Suppl. 8. Vol.110 (1999) 60 Poster 1421
• Werner P. , K. Scheerschmidt, N.D. Sacharov, M. Grundmann, A. Taurino und R. Schneider
  Morphology and Strain: TEM Image
  Contrast of Self-Assembled Quantum Dot Structures of Semiconducting Materials 29. Tagung der DGE, Dortmund, 5.-10.9.1999 Poster 1431   PDF 0.7MB
• Kirmse H. , W. Neumann, T. Wiebach, R. Köhler, K. Scheerschmidt und D. Conrad
  Quantitative Analyse elektronenmikroskopischer Bildkontraste von CdSe/ZnSe-Quantenpunkten
  Optik, Suppl. 8 (Vol.110)30 29. Tagung der DGE, Dortmund, 5.-10.9.1999 Poster 0730, nicht gezeigt
• Scheerschmidt K., D. Conrad, A.Y. Belov, and D. Timpel
  Enhanced semi-empirical potentials in molecular dynamics simulations of wafer bonding
  E-MRS'99 Meeting, Strasbourg, France, 1.-4.6.1999, Symposium L: Ab Initio Approaches to Microelectronics Materials and Process Modelling Poster L-P8, Abstracts SL-10
• Kirmse H., W. Neumann, T. Wiebach, R. Koehler, K. Scheerschmidt und D. Conrad
  Computer-aided analysis of TEM images of CdSe/ZnSe quantum dots
  Proc. E-MRS'99 Spring Meeting, Strasbourg, France, 1.-4.6.1999, Symposium I: Microcrystalline and Nanocrystalline Semiconductors Vortrag I-III.20, Abstracts SI-19
• Scheerschmidt K., A.Y. Belov, and D. Conrad
  Structure modelling by molecular dynamics: Analysis of TEM images of bonded interfaces,
  Autumn School of the International Centre of EM and Materials Sciences at the MPI Halle, "New Techniques in Electron Microscopy for Materials Sciences", 25.-30.9.1999, Halle Poster
• Scheerschmidt K., D. Conrad, A.Y. Belov, and D. Timpel
  Molecular dynamics and HREM simulations of wafer bonded interfaces
  Symposion: Prospects of Quantitative High Resolution Electron Microscopy, 21.-23.7.1999, Schloss Ringberg Poster
• Scheerschmidt K.
  Inversion of dynamic scattering: Determination of local object thickness and orientation
  Symposion: Prospects of Quantitative High Resolution Electron Microscopy, 21.-23.7.1999, Schloss Ringberg Diskussionsbeitrag und Poster
  
• Scheerschmidt K. Strukturuntersuchungen im Elektronenmikroskop als inverses Problem
  3. Workshop des AK Elektronenmikroskopie der DGK, 11.-12.3.1999, Leipzig
• Scheerschmidt K. Simulations to analyze HREM structure images
  Joint spring-meeting '99 of JEM-user from Germany, Switzerland and Benelux, 9.-11.5.1999, Darmstadt
• Scheerschmidt K. Object reconstruction as an inverse problem
  Autumn School of the International Centre of EM and Materials Sciences at the MPI Halle, "New Techniques in Electron Microscopy for Materials Sciences", 25.-30.9.1999, Halle
• Scheerschmidt K., D. Conrad
  Kristalldefekte an gebondeten Grenzflaechen: MD-Strukturrelaxation und TEM-Abbildung
  Seminarvortrag MPI Stuttgart, 26.10.1999
• Scheerschmidt K.
  Structure of quantum dots: MD- and TEM-Simulations
  INTAS meeting, Halle 26.3.1999
• K. Scheerschmidt
  Elektronenmikroskopische Strukturuntersuchung von Quantenpunkten: Molekulardynamik und Bildsimulation
  Seminarvortrag TU-Berlin, 3.11.1999
• Scheerschmidt K.
  Beitraege empirischer Molekulardynamik zur Quantitativen Elektronenmikroskopie
  VW-Projekttreffen: Quantitative Hochaufloesungs-Elektronenmikroskopie, MPI-Halle, 22.-23.11.1999
• Kirmse H., W. Neumann, T. Wiebach, R. Köhler, K. Scheerschmidt und D. Conrad
  Interpretation von TEM-Beugungskontrast-Abbildungen von CdSe-Quantenpunkten 7. Jahrestagung DGK, 08.-10.03.1999, Leipzig, Suppl. Z. Krist. 16 (1999) 169.
• Vorlesung: K. Scheerschmidt, D. Conrad, Dresden, ab 11.11, 7 Doppelstunden 14-tägig, zu: Molekulardynamik und Dynamische Wechselwirkung - Grundlagen elektronenmikroskopischer Strukturanalyse

• 1998

• Belov, A.Yu., K. Scheerschmidt, and U. Goesele
  Extended point defect structures at intersections of screw dislocations in Si: a molecular dynamics study
  phys. stat. sol., in print ==> Poster: EDS98, Proc. Extended Defects in Semiconductors, Sept. 6-11.1998, Jaszowiec,Poland (Abstracts)
• Kirmse, H., R. Schneider, K. Scheerschmidt, D. Conrad, and W. Neumann
  TEM characterization of self-organized CdSe/ZnSe quantum dots
  Journal of Microscopy, in print ==> Poster: FEMM98, Irsee, 1998 Frontiers of Electron Microscopy in Material Science, Symposium "Quantitative Methods in TEM", Kloster Irsee 19.-24.4.1998, Irsee, Germany
• K. Scheerschmidt:
  Molecular dynamics investigations of wafer bonding: Structures, forces and defects at interfaces
  Poster: 17th General Conf. Condensed Matter Div. and 6emes Journees de la Matiere Condense CMD17 - JMC6, Grenoble, France, 25-29.8.1998 (Abstracts)
• K. Scheerschmidt: Forces and Defects at wafer bonded interfaces studied by molecular dynamics simulations
  Vortrag: Workshop Simulation of Microstructure and Strength of Materials, MPI Stuttgart, 20.-21.7.1998 (Abstracts)
• K. Scheerschmidt: Molekulardynamische Untersuchungen von gebondeten Grenzflächen
  Seminarvortrag (eingeladen): Universitaet Augsburg, 15.6.1998
• K. Scheerschmidt, A.Yu. Belov, D. Conrad, D. Timpel: Molecular dynamics investigations of wafer bonding
  Vortrag: Workshop on bonded and compliant substrates Puerto Rico, 1.-5.2.1998 (Abstracts)
• K. Scheerschmidt, D. Timpel: Molecular dynamics studies of wafer bonded interface structures and related diffusion processes in a-silica
  Vortrag: Intern. Workshop Nanoscale Structure and Kinetics at Solid Interfaces, Halle 28-30.9.1998 (Abstracts)
• K. Scheerschmidt:
  Inverse Probleme in der Elektronenmikroskopie
  Vortrag: WE-Heraeus-Ferienkurs für Physik: Mathematische Methoden und Computeralgebra in der Physik, Halle, 14-25.9.1998 (Handouts)
• Timpel D., K. Scheerschmidt
  Molecular dynamics investigations of silver particles in glass
  J. Non-Cryst. Solids 232-234, 245-251 (1998) ==> Vortrag 7.th Int. Conf. on the Structure of Non-Cryst. Materials (NCM 7), Cagliari, Sardinien, 15-19.9.1997 (J. Non.Cryst.Solids 232-234 sind Proceedings)
• D. Timpel, K. Scheerschmidt:
  Molecular dynamics investigations of hydrophilic wafer bonding and related diffusion processes in a-silica
  Poster: ESF Europ. Research Conf. on Computational Physics for Nanotechnology, Il Ciocco, Italy, 19-24.9.1998 (Abstracts)
• K. Scheerschmidt:
  Waferbonden von Halbleitern - Experiment und MD-Simulation
  Universitaet Jena, 18.11.1998
  Eingeladener Seminarvortrag
• Scheerschmidt, K. and Lichte, H.:
  Determination of object thickness and orientation from electron holograms
  Proceedings of the 14th International Congress of Electron Microscopy (Electron Microscopy 1998), ICEM14, Cancun, Mexiko, 31.8-4.9.1998, Vol. 1, pp 423-424
  (Eds.) Benavides, H. A. C. and Yacaman, M. J., Inst. Of Physics Publ., Bristol and Philadelphia (1998)   PDF 2MB
• Neumann, W. and Kirmse, H., Schneider, R., Scheerschmidt, K., Conrad, D., Rabe, M., Henneberger, F.:
  TEM investigation of self-organized CdSe/ZnSe quantum dots
  Proceedings of the 14th International Congress of Electron Microscopy (Electron Microscopy 1998), ICEM14 Cancun, Mexiko, 31.8-4.9.1998, Vol. 3 pp 367-368
  (Eds.) Benavides, H. A. C. and Yacaman, M. J., Inst. Of Physics Publ., Bristol and Philadelphia (1998)
  Vortrag
• Scheerschmidt, K.:
  Direct local determination of object thickness and orientation from diffracted electron waves
  Proceedings of the 11th Europ. Congress on Electron Microscopy (Electron Microscopy 96) 2, pp 466-467 (Ed.)
  Committee of European Societies of Microscopy, European Societies of Microscopy, Brussels, Belgium (1998)
• Vorlesungen: Dresden, ab 23.10, 7 Doppelstunden 14-tägig, zu: Dynamische Wechselwirkung von Elektronen mit Festkörpern in der Elektronenmikroskopie

• 1997

• Belov, A. Y., D. Conrad, K. Scheerschmidt and U. Gösele,
  Atomistic modelling and HREM-imaging of dislocations associated with steps at Si/Si(001) vicinal interfaces,
  Proc. Microscopy of Semiconductor Materials, Oxford, Inst. of Physics, 157 (1997) 63-66.
• M. Reiche, K. Scheerschmidt, D. Conrad,R. Scholz, A. Ploessl, U. Gösele, K.-N. Tu,
  Dislocation Structure in Interfaces of Bonded Hydrophobic Silicon Wafers: Experiment and Molecular Dynamics,
  Proc. Microscopy of Semiconductor Materials, Oxford, Inst. of Physics, 1997, Inst. Phys Conf. Ser. 157 447-450.
• Kosogov, A. O., Werner, P., Scheerschmidt, K., Ledentsov, N. N., Bert, N. A., Konnikov, S. G., Gösele, U., Bimberg, D.:
  Self-organized (In,Ga)As quantum dots: from conventional to multilayered structures
  Proceedings of the 11th Europ. Congress on Electron Microscopy (EUREM '96) U.C.D. Belfield, on CD ROM, Dublin, Ireland (1996)
• Timpel, D. and K. Scheerschmidt,
  Molecular dynamics investigations of silver particles in glass,
  7th Intern. Conf. on the Structure of Non-Cryst. Materials, September 15-19, 1997 - Sardegna Italy (Vortrag)
• Timpel, D., K. Scheerschmidt,
  Molecular dynamics invetigations of nanocrystalline silver particles in glasses,
  Workshop: Computer Simulation of Fracture, Interfaces and Deformations, Stuttgart 3.7.1997 (Vortrag)
• Scheerschmidt, K., D. Conrad, A. Belov and U. Gösele,
  Molecular dynamics and HREM investigations of silicon wafer bonding,
  16. th General Conf. Condensed Matter Division of EPS, August 25-28,1997, Leuven, Belgien Vortrag am 28.8, abstract
• Scheerschmidt, K., D. Conrad, A. Belov and H. Stenzel,
  UHV-silicon wafer bonding at room temperatures: Molecular dynamics and experiments,
  Proc. 1997 Joint Intern. Meeting of the Electrochemical Society, August 31- September 5, 1997, Paris, France   abstract and extended paperPDF 12Mb
  (Eingeladener Vortrag am 2.9.,extended abstract in Proceedings, paper gleichlautend ist für J. Electroch. Soc. eingereicht und angenommen)
• Scheerschmidt, K.,
  Direkte Parameter- und Objektrekonstruktion aus elektronen-holographisch ermittelren Objektwellen,
  Dreiländertagung , September 7.-12, 1997, Regensburg, Deutschland
  (Eingeladener Vortrag 8.9, Abstract 1.1-11 und in Optik Suppl. ?, 1997)
• Scheerschmidt, K. ,D. Conrad, A. Belov and U. Gösele,
  Molekulardynamik und Elektronenmikroskopie an Grenzflächen gebondeter Silizium-Wafer,
  Dreiländertagung , September 7.-12, 1997, Regensburg, Deutschland
  (Poster 10.9, Abstract PIII-187 und in Optik Suppl. ?, 1997)
• Scheerschmidt, K.,
  Retrieval of object information by inverse problems in electron diffraction,
  in: Proc. Workshop "Image analysis methods in quantitative TEM", March 9-14,1997,Schloss Ringberg, Germany,
  J. of Microscopy (1997) in print, Vortrag dazu war am 13.3.97
• Vorlesungen: Dresden, ab 24.10, 7 Doppelstunden 14-tägig,
  zu: Dynamische Wechselwirkung von Elektronen mit Festkörpern in der Elektronenmikroskopie
  

• 1996

• A. Belov, D. Conrad, K. Scheerschmidt, U. Goesele,
  Atomistic study of interfaces resulting from silicon wafer bonding,
  Proc. Proc. Ecole Dislocations 96, Interfaces et Plasticite, 21.-28 10. 1996, Tozeur, Tunesien, 1996, .
• D. Conrad, K. Scheerschmidt, U. Gösele,
  Molecular dynamics of UHV silicon wafer bonding
  Proc. 1996 MRS Spring Meeting, San Francisco, 8.-12.4.1996, 1996, p. 400.
• U. Gösele, C. Conrad, K. Scheerschmidt, H. Stenzel, M. Reiche, T. Martini, D. Hesse,
  Seminconductor wafer bonding: science and technology,
  Proc. Interface Science and Mater. Interconn., Proc. 8th Japan Institute of Metals Intern. Symp. JIMIS-8/iib 96 Conf., Toyama/Japan, July 1-4,1996, 1996.   PDF 1.1MB
• A. O. Kosogov, P. Werner, K. Scheerschmidt, N. N. Ledentsov, N. A. Bert, S. G. Konnikov, U. Gösele, D. Bimberg,
  Self-organized (In,Ga)As quantum dots: from conventional to multilayered structures,
  Proc. EUREM 96, Dublin, 1996, .
• S. Ruvimov, Z. Liliental-Weber, N.N. Ledentsov, M. Grundmann, D. Bimberg, V.M. Ustinov, A.Yu. Egorov, P.S. Kop'ev, Zh.I Alferov, K. Scheerschmidt, and U. Gösele
  TEM structural characterization of nm-scale islands in highly mismatched systems,
  MRS Proceedings 1996, Spring Meeting, Compound Semiconductor Electronics and Photonics, Edited by: R. J. Shul, S. J. Pearton, F. Ren, and C-S. Wu, San Francisco, 8.-12.4.1996, 1996, vol. 421, p. 383.
• K. Scheerschmidt,
  Retrieval of object information from electron diffraction as ill- posed inverse problems,
  Proc. Conference on inverse problems of wave propagation and diffraction, 23.- 27.9.96, Aix-les-Bains, Frankreich, Springer Verlag, Lecture Notes in Physics 486,(1997) 7.
• Scheerschmidt, K.,
  Retrieval of object information from electron diffraction as ill- posed inverse problems, in: Inverse problems of wave propagation and diffraction,
  Proceeding of the Conference in Aix-les-Bains, 23.- 27.9.96, Frankreich, Lecture Notes in Physics, Vol. 486, Springer Vlg. Berlin-Heidelberg (1997) p.71-85
• Conrad, D., K. Scheerschmidt and U. Gösele,
  Molecular dynamics of UHV silicon wafer bonding,
  Proc. 1996 MRS Spring Meeting, San Francisco, 8.-12.4.1996, 1996, p. 400.
• K. Scheerschmidt,
  Direct local determination of object thickness and orientation from diffracted electron waves,
  Proc. EUREM 96, Dublin, 1996, .
• K. Scheerschmidt, D. Conrad, A.Belov, U. Goesele,
  Molecular dynamics modelling of silicon wafer bonding,
  Proc. 6th Intern. Workshop Computational Mechanics of Materials, Technische Universitaet Hamburg, 7.-8.10.96, 1996, .
• K. Scheerschmidt, D. Conrad, H. Stenzel, U. Gösele,
  Silicon wafer bonding: Molecular dynamics simulations and UHV-experiments,
  Proc. 10. Deutsch-Japanisches Forum Informationstechnologie, Kloster Seeon, 30.4.-3.5.1996, 1996, .
• K. Scheerschmidt, D. Conrad, H. Stenzel, U. Gösele,
  Silicon wafer bonded interface structures: Molecular dynamics simulations and HREM investigations,
  Proc. EUREM 96, Dublin, 1996, .
• D. Timpel, K. Scheerschmidt,
  Molecular dynamics structure simulations of Ag-particles in glass for HREM, B. G. A. Czyrska-Filemonowicz H. Adrian, J. Wojtas, A. Zielinsky-Lipiecs (Ed.),
  Proc. IX Conference on Electron Microscopy of Solids, Krakow-Zakopane, Poland, 6-9-May, FOTOBIT, 1996, vol. 1, p. 331-334.   PDF 60Kb

• 1995

• D. Conrad, K. Scheerschmidt, U. Gösele,
  Molecular Dynamics of Semiconductor Surfaces and Interfaces,
  Proc. BIOSYM/Molecular Simulations International Materials Science Symposion, 11.9.95 and Seminar of the Department of Materials of the Oxford University, 18.9.95, Cambridge, 1995, .
• D. Conrad, K. Scheerschmidt, U. Gösele,
  Interaction of Si(001) Surfaces: A Molecular Dynamics Study,
  Proc. Nato Advanced Study Institute "Computer Simulation in Materials Science - Nano/Meso/Macroscopic Space and Time Scale", Ile D'Oleron, France, 1995, .
• D. Conrad, K. Scheerschmidt, U. Gösele,
  Molecular Dynamics Simulations for Semiconductor Wafer Bonding,
  Proc. Workshop "BRD in Germany", Halle, 1995, .
• W. Neumann, H. Hofmeister, D. Conrad, S. K., S. Ruvimov,
  Charakterisierung von Grenzflächenstrukturen in nanokristallinem Germanium mittels HREM und Molekulardynamischen Simulationen,
  Proc. 3. Jahrestagung der DGK, Darmstadt, R. Oldneburg-Vlg. München, 1995, .
  
• S. Ruvimov, et al.,
  TEM/HREM characterization of self-organized (In,Ga)As quantum dots, A. G. Cullis, A. E. Staton-Bevans (Eds.),
  Proc. 9th Microscopy Semicond. Mater. Conf., Oxford, IOP publishing Ltd., 1995, vol. 1, p. 31-34.   PDF 0.3Mb  
• K. Scheerschmidt, D. Conrad, U. Gösele,
  Molecular dynamics simulations to investigate wafer bonded interfaces,
  Proc. 5th. Int. Workshop: Computational Modelling of the Mechanical Behaviour of Materials, Aachen, 1995, .
• K. Scheerschmidt, F. Knoll,
  Retrieval of atomic displacements from reconstructed electron waves as an ill-posed inverse problem, A. Tonomura, L. F. Allard, G. Pozzi, D. C. Joy, Y. A. Onos (Eds.),
  Proc. Int. Workshop on Electron Holography- Theory, Applications and Future prospects, Knoxville Tennessee USA August 1994, Elsevier Science B.V., 1995, vol. 1, p. PDF 3.3MB
• K. Scheerschmidt, S. Ruvimov, D. Timpel,
  HREM - analysis of interfaces on the basis of molecular dynamic structure relaxations, A. G. Cullis, A. E. Staton-Bevans (Eds.),
  Proc. 9th Microscopy Semicond. Mater. Conf., Oxford, IOP publishing Ltd., 1995, vol. 1, p. 39-42.
• K. Scheerschmidt, D. TImpel, D. Conrad,
  Molecular dynamics structure modelling and HREM - imaging of interfaces in semiconductors and glasses,
  Proc. Nato Advanced Study Institute "Computer Simulation in Materials Science - Nano/Meso/Macroscopic Space and Time Scale", Ile D'Oleron, France, 1995, .
• L. M. Sorokin, J. L. Hutchison, K. Scheerschmidt, G. N. Mosina, N. B. Ponomariova,
  TEM and HREM study of microstructure of FZ-silicon crystal , grown at varying high rates, A. G. Cullis, A. E. Staton-Bevans (Eds.),
  Proc. 9th Microscopy Semicond. Mater. Conf., Oxford, IOP publishing Ltd., 1995, vol. 1, p. 495-498.
• L. M. Sorokin, J. L. Hutchison, K. Scheerschmidt, V. I. Sokolov, V. V. Ratnikov, A. M. Danischevski, G. N. Mosina, N. B. Ponomariova, The
  Microstructure of FZ Silicon Grown at Varying High Rate (5-10 mm/min),
  Proc. EMRS1995 Spring Meeting, Strasbourg, 1995, .
• D. Timpel, K. Scheerschmidt,
  Struktursimulation von Silberteilchen in Gläsern mittels Molekulardynamik,
  Proc. XVI (3.) Arbeitstagung des Arbeitskreises nichtkristalline und partiellkristalline Strukturen der DGK: Strukturuntersuchungen an nichtkristallinen und partiellkristallinen Stoffen, Schmiedefeld am Rennsteig, 1995, .
• D. Timpel, K. Scheerschmidt, S. Ruvimov,
  HREM Simulations of Particles and Interfaces Refined by Molecular Dynamics Relaxations,
  Proc. EMRS 1995 Spring Meeting, Strasbourg, 1995, .

• 1994

• S. Ruvimov, K. Scheerschmidt, P. Werner, A. Höpner, J. Heydenreich, S. Ivanov,
  Structure characterization of interfaces in MBE grown quantum wells based on GaAs and GaSb by 400 kV HREM,
  Proc. Electron Microscopy: Proc. 13. ICEM, Paris, 1994, vol. 1, p. 403- 405.
• K. Scheerschmidt,
  Application of Molecular Dynamic Calculations to the Simulation of Interfaces, J. Heydenreich, W. Neumanns (Eds.),
  Proc. 33st Course Int. Centre of Electron Microscopy " Electron Microscopy of Boundaries and Interfaces in Materials Science", Halle, Elbe Druckerei, 1994, p. 112-122.
• K. Scheerschmidt,
  HREM structure characterization of relaxed interfaces in covalently bonded materials, P. Borgesen, e. al.s (Eds.),
  Proc. MRS Spring Meeting 1994, San Francisco, 1994, vol. 338, p. 121-126.   PDF 2MB
• K. Scheerschmidt, F. Knoll,
  Direct electron diffraction contrast analysis as an inverse problem,
  Proc. 13. Int. Conf. Electron Microscopy (ICEM), Paris, 1994, vol. 1, p. 333- 334.
• K. Scheerschmidt, F. Knoll,
  Retrieval of atomic displacements from reconstructed electron waves as an ill-posed inverse problem,
  Proc. Int. Workshop on Electron Holography Theory, Applications and Future prospects, August, Knoxville, Tennessee, USA, 1994, p. P10.

• 1993

• K. Scheerschmidt, D. Timpel,
  Molecular dynamics structure modelling of metallic particles in glass for image simulation in HREM,
  Proc. 13. Int. Conf. Electron Microscopy (ICEM), Paris, 1994, vol. 2A, p. 395-396.
• N. I. Bochareva, S. S. Ruvimov, R. Scholz, K. Scheerschmidt, J. Heydenreich, L. M. Sorokin,
  HREM and DLTS of Σ=37(610)\[001]tilt grain boundary in Ge,
  Proc. Conf. Microsc. of Semicond Mater., Oxford, Oxford Inst. Phys., 1993, vol. 134, p. 83-86.
• R. Hillebrand, H. Hofmeister, K. Scheerschmidt, J. Heydenreich,
  Structure investigations of CdTe crystallites in HREM,
  Proc. 13th Gen. Conf. Cond. Matter Div. Europ. Phys.Soc., Regensburg, 1993, vol. 1, p. 1361.
• R. Hillebrand, H. Hofmeister, K. Scheerschmidt, J. Heydenreich,
  HREM characterization of small CdTe particles,
  Proc. Conf. Microsc. Semicond. Mater., Oxford, Inst. Phys., 1993, vol. 134, p. 47-50.
• S. S. Ruvimov, K. Scheerschmidt,
  Dislocation parity analysis applied to unify the Burgers vector determination by TEM,
  Proc. EMAG 93, Liverpool, Inst. Physics, 1993, vol. 138, p. 341-344.   PDF 0.7MB
• K. Scheerschmidt, F. Knoll,
  A special inverse problem of electron diffraction,
  Proc. Int. Conf. on Inverse Problems: Principles and Applications, Potsdam, 1993, .
• K. Scheerschmidt, S. S. Ruvimov, P. Werner,
  HREM structure characterization of interfaces in epitaxial MBE-grown multilayers based on GaAs and GaSb,
  Proc. EMAG 93, Liverpool, Inst.Phys., 1993, vol. 138, p. 259-262.
• D. Timpel, K. Scheerschmidt,
  Structure investigation of precipitates by molecular dynamics in HREM,
  Proc. 13th Gen. Conf. Cond. Matter Div. Europ. Phys.Soc., Regensburg, 1993, vol. 1, p. 1415.

• 1992

• R. Hillebrand, H. Hofmeister, K. Scheerschmidt,
  Experimental and theoretical HREM studies on small CdTe particles,
  Proc. X.th EUREM, Granada, 1992, vol. 1, p. 511.
• K. Scheerschmidt, R. Hillebrand, R. Bierwolf, M. Hohenstein,
  Autotuning in HREM for crystalline specimens: a theoretical treatment,
  Proc. X.th EUREM, Granada, 1992, vol. 1, p. 541.

• 1991

• R. Hillebrand, K. Scheerschmidt,
  Kontrastoptimierung in der HREM durch Erweiterung des KPF-Konzeptes,
  Proc. 25. Tagung der DGE, Darmstadt, 1991, p. 013.
• R. Hillebrand, K. Scheerschmidt,
  Application of numerical tools in HREM,
  Proc. 32st Course Int. Centre of Electron Microscopy "High Resolution Electron Fundamentals and applications", Halle, 1991, p. 20-21.
• R. Hillebrand, K. Scheerschmidt,
  Intensitäten und Phasen gebeugter Elektronenwellen von nichtzentrosymmetrischen Kristallen,
  Proc. Referate Gemeinsame Tagung AG Kristallographie u. Vereinigung für Kristallographie, München, 1991, p. 264.
• K. Scheerschmidt,
  Ist elektronenmikroskopische Strukturanalyse möglich?,
  Proc. 25. Tagung der DGE, Darmstadt, 1991, p. 164.
  Eingeladener Vortrag
• K. Scheerschmidt, R. Hillebrand,
  Untersuchungen zur Kohärenz und Linearität des Abbildungsprozesses in der HREM,
  Proc. 25. Tagung der DGE, Darmstadt, 1991, p. 021.
• K. Scheerschmidt, R. Hillebrand,
  Image Interpretation in HREM: Direct and indirect methods,
  Proc. 32st Course Int. Centre of Electron Microscopy "High Resolution Electron Fundamentals and applications", Halle, 1991, p. 15-16.
• K. Scheerschmidt, R. Hillebrand, H. Lichte, E. Völkl,
  Objektinformation aus Amplitude und Phase gebeugter Elektronenwellen,
  Proc. 25. Tagung der DGE, Darmstadt, 1991, p. 006.
  
• K. Scheerschmidt, H. Lichte,
  Zum Phasenproblem der Elektronenbeugung,
  Proc. Referate Gemeinsame Tagung AG Kristallographie u. Ver einigung für Kristallographie, München, 1991, p. 246.
  

• 1990

• K. Scheerschmidt,
  Fundamental principles and numerical evaluation of the dynamical diffraction theory,
  Proc. 31st Course Int. Centre of Electron Microscopy "Electron diffraction possibilities and limitations", Halle, 1990, p. 8-9.
• K. Scheerschmidt,
  Optimized interpretation of HREM images using computer simulation,
  Proc. Proc. XIV Allun. Konf. Electr. Micr., Suzdal, 1990, .

• 1989

• R. Hillebrand, K. Scheerschmidt,
  Theoretische Untersuchungen zur HREM-Strukturabbildung von Verbindungshalbleitern,
  Proc. Jahreshaupttagung u. Schultagung Phys. Ges. DDR, Karl-Marx Stadt, 1989, p. 45.
• R. Hillebrand, K. Scheerschmidt, J. Heydenreich,
  HREM-contrast calculations applied to A3B5-compounds: a discussion of imaging parameters (KPF focus),
  Proc. 12th Eur. Crystallographic Meeting, Moscow, 1989, vol. 1, p. 33.
  

• 1988

• R. Hillebrand, K. Scheerschmidt,
  HREM-Simulationen zur Strukturerkennbarkeit von Verbindungshalbleitern,
  Proc. 12. Tagung Elektronenmikroskopie, Dresden, 1988, p. 261 & A85.
• R. Hillebrand, K. Scheerschmidt,
  Optical diffraction in electron microscopy,
  Proc. 12. Tagung Elektronenmikroskopie, Dresden, 1988, p. 283 & A96.
• R. Hillebrand, P. Werner, K. Scheerschmidt,
  Fundamentals and applications in HREM,
  Proc. 26th Course Int. Centre of Electron Microscopy "The present state of the art of TEM in materials science", Halle, 1988, p. 19-20.
• W. Neumann, R. Hillebrand, K. Scheerschmidt,
  HREM-Simulation zur Untersuchung von Netzwerkstrukturen: a-Kohlenstoff, i-Kohlenstoff, SiO2-Gläser,
  Proc. 12. Tagung Elektronenmikroskopie, Dresden, 1988, .
• W. Neumann, K. Scheerschmidt, R. Hillebrand, J. Hopfe,
  Computer simulation of HREM images of amorphous materials, S. A. Firstovs (Ed.),
  Proc. Struktura mechaniceskie svojstva i razrusenie real'nych kristallov: sbouz nauchn. trudov, Kiev, Akad. Nauk Ukrainsk. SSR, 1988, p. 17-23.
• K. Scheerschmidt,
  Computer simulation of HREM images of small lattice defects, S. A. Firstovs (Ed.),
  Proc. Struktura mechaniceskie svojstva i razrusenie real'nych kristallov: sbouz nauchn. trudov, Kiev, Akad. Nauk Ukrainsk. SSR, 1988, p. 43-48.
• K. Scheerschmidt, R. Hillebrand,
  Berechnung der Abbildung kleiner Kristalldefekte: Defokussierter Beugungskontrast und Netzebenenabbildung,
  Proc. 12. Tagung Elektronenmikroskopie, Dresden, 1988, p. 255 & A82.
• K. Scheerschmidt, R. Hillebrand,
  HREM-Simulation für Modelle amorpher Festkörper,
  Proc. 12. Tagung Elektronenmikroskopie, Dresden, 1988, vol. 60 & A13,p?? .
• K. Scheerschmidt, R. Hillebrand,
  Electron microscope image simulations of "small" crystal defects,
  Proc. XIIIth Conf. on Appl. Crystallography, Cieszyn, Poland, 1988, vol. 2, p. 473.
• K. Scheerschmidt, R. Hillebrand, W. Neumann,
  Computersimulation der Hochauflösungs-Abbildung amorpher Objekte,
  Proc. 12. Tagung Elektronenmikroskopie, Dresden, 1988, p. 60 & A13, p??.
• K. Scheerschmidt, R. Hillebrand, W. Neumann,
  Computersimulation der HREM-Abbildung amorpher Objekte,
  Proc. Jahreshaupt u. Schultagung Phys. Ges. DDR, Dresden, 1988, p. 54.
  Phys. Ges. DDR, Dresden, 1988, p. 54.

• 1986

• R. Hillebrand, K. Scheerschmidt,
  Computer simulation of defocus diffraction contrast images and lattice fringe patterns of small crystal defects,
  Proc. 10th Europ. Crystallographic Meeting, Wroclaw, 1986, vol. 1, p. 547.
• K. Scheerschmidt,
  Fundamental principles and numerical evaluation of the dynamical diffraction theory,
  Proc. 22nd Course Int. Centre of Electron Microscopy "Fundamentals and application of electron diffraction methods", Halle, 1986, p. 20-21.
• K. Scheerschmidt, J. Heydenreich,
  Interpretation of electron microscope lattice defect images,
  Proc. 10th Eur. Crystallographic Meeting, Wroclaw, 1986, p. 42.

• 1984

• R. Hillebrand, W. Neumann, K. Scheerschmidt, P. Werner,
  Möglichkeiten und Grenzen der Interpretation von Hochauflösungsabbildungen,
  Proc. 11. Tagung "Elektronenmikroskopie", Dresden, 1984, vol. 1, p. 37 & A9.
• R. Hillebrand, K. Scheerschmidt,
  Computersimulation von Strukturabbildungen für Silicium <110>,
  Proc. 11. Tagung "Elektronenmikroskopie", Dresden, 1984, vol. 11, .
• R. Hillebrand, K. Scheerschmidt, W. Neumann,
  HREM-simulations for silicon using particular imaging conditions,
  Proc. 8th Eur. Congr. on Electron Microscopy, Budapest, 1984, vol. 1, p. 271.

• 1982

• K. Scheerschmidt, R. Hillebrand,
  Fourier imaging and simulated diffraction contrast,
  Proc. 11th Hung. Diffraction Conf., Györ, 1982, vol. 1, p. 126.
  Vortrag

• 1981

• K. Scheerschmidt, S. A. Nepijko, S. Carl,
  Über die Sichtbarkeit von Kristalldefekten in der Interferenz-Elektronenmikroskopie,
  Proc. 10. Tagung "Elektronenmikroskopie", Leipzig, 1981, p. 276 & A95.
  Vortrag

• 1980

• K. Scheerschmidt, U. Richter,
  Electron diffraction of slip traces and slip bands,
  Proc. 10th Hung. Diffraction Conf., Balatonaliga, 1980, p. A33.   PDF 1MB
  Vortrag

• 1979

• D. Baither, G. Kästner, U. Richter, K. Scheerschmidt,
  EM analysis of defects produced by high temperature annealing of ion implanted silicon crystals,
  Proc. 11th Conf. on Electr. Microsc. of USSR, Tallin, 1979, vol. 3, p. 101.
  Vortrag

• 1978

• J. Heydenreich, K. Scheerschmidt,
  Actual problems of the simulation of electron diffraction contrast,
  Proc. 11th Int. Congr. on Crystallography, Warszawa, 1978, vol. 1, p. 267.
  Eingeladener Vortrag
• K. Scheerschmidt,
  Computer simulation of electron diffraction contrast of dislocation networks using angular dislocations,
  Proc. 11th Int. Congr. on Crystallography, Warszawa, 1978, vol. 1, p. 262.
  Vortrag
• K. Scheerschmidt,
  Der Einfluss von Grenzflächen auf den Elektronenbeugungskontrast geradliniger Kristalldefekte,
  Proc. 9.Tagung "Elektronenmikroskopie", 1978, vol. 1, p. 43 & A13.
  Vortrag

• 1977

• K. Scheerschmidt,
  Computer simulation of the electron microscopic diffraction contrast of dislocations near surfaces,
  Proc. Proc. 15th Czech. Conf. on Electron Microscopy, Prague, 1977, vol. B, p. 619.
  Vortrag

• 1976

• J. Heydenreich, K. Scheerschmidt,
  Present state of crystal defect detection by electron microscopic diffraction contrast,
  Proc. 5th Int. Summer School on Lattice Defects in Crystals, Krynica, 1976, p. 151-164.
  2 Vorträge, Teil 1 Grundlagen Teil 2 Simulation und Anwendungen
  

• 1975

• J. Heydenreich, K. Scheerschmidt,
  Computersimulation der elektronenmikroskopischen Abbildung von Versetzungssprüngen,
  Proc. 10th Int. Congr. on Crystallography, Amsterdam, 1975, vol. 1, p. 261.
  Vortrag
• K. Scheerschmidt,
  Computersimulation des elektronenmikroskopischen Beugungskontrastes von Versetzungssprüngen,
  Proc. 8. Tagung "Elektronenmikroskopie", Berlin, 1975, p. 347.
  Vortrag   PDF 1.2MB